claude

chip-design-dft

Design for Test — scan insertion, ATPG, MBIST, JTAG boundary scan

231 on GitHubby chuanseng-ngv1.2.2MITupdated 2 days ago
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Plugin chip-design-dft from marketplace digital-chip-design-agents in hdl-tools/digital-chip-design-agents. Commands read from the repo's manifest — 2 days ago.

What it installs

Skills (1)

  • dft

    Design for Test — scan architecture planning, scan insertion, ATPG pattern generation, MBIST for embedded memories, and JTAG boundary scan. Use when planning a DFT strategy, inserting scan, generating test patterns, or verifying that a chip will be testable in manufacturing.

Subagents (1)

  • dft-orchestrator

    Orchestrates the DFT flow from architecture through scan insertion, ATPG pattern generation, BIST, JTAG, and sign-off. Invoke when planning a DFT strategy, inserting scan, generating test patterns, or verifying testability. - digital-chip-design-agents:dft

View source on GitHub

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